Bespoke & Custom Solutions

MetPrep expertise in providing solutions to fit applications where a standard instrument and or available components just can’t reach the desired outcome, is longstanding.

The image shows a low cost solution for an automated 200mm wafer inspection system, in this case based on the Zeiss AxioScope 7 with automated stage and focussing.

We have decades of experience in bespoke solutions and welcome all enquiries in this area

Custom system image 1
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