ZEISS LSM 900, the confocal laser scanning microscope (CLSM) from ZEISS, is the one instrument you will need for materials analysis. Characterize 3D microstructures surfaces topography in your lab or multi-user facility. LSM 900 enables precise, three-dimensional imaging and analyses of nanomaterials, metals, polymers, and semiconductors. Extend your upright light microscope, ZEISS Axio Imager.Z2m or your inverted light microscope ZEISS Axio Observer 7, with a confocal scanning module. Combine all essential light microscopy contrasting techniques for materials with high precision topography. With no the need to change microscopes, you’ll save time on set-up. Benefit from automated data acquisition and post-processing. Execute non-contact confocal imaging when evaluating surface roughness.